RLDRAMメモリ

RLDRAM

ネットワーク機器用に製造

RLDRAMメモリは低レイテンシ、広帯域幅のDRAMであり、要求の厳しいネットワーク機器タスクやL3キャッシュ、連続読み込み/書き込み操作、または完全なランダムアクセス用に設計されています。

dish sunsetRLDRAM® Memory:圧倒的な帯域幅と低レイテンシ

持続可能な広帯域幅を実現
Our reduced-latency DRAM (RLDRAM® memory) is a high-performance, high-density memory solution that offers fast SRAM-like random access and outpaces even leading-edge DDR3 for sustained high bandwidth.RLDRAMは革新的な回路設計を採用しており、アクセス サイクルの開始時と最初のデータが利用可能になるまでの時間を最短にします。極めて短いバス ターンアラウンドタイムにより、読み取り/書き込みの短期的なバランスを保ちながら、より高く持続可能なバンド幅を実現します。バンクスケジュール式オート リフレッシュ機能により、コントローラが通常動作の背後でREFRESHコマンドを実行できるようにして、帯域幅を改善しています。こうした特徴を備えているRLDRAMは、10GbE、40GbE、100GbEパケットバッファリングと検査に最適な選択肢であり、さまざまなFPGAおよびネットブックプロセッサソリューションに対応しています。

RLDRAM2と3製品カタログおよび関連資料

RLDRAM 3 – 新世代の当社最高の低レイテンシメモリを体験する
今や第3世代となった当社最高の低レイテンシメモリソリューションはさらに性能が向上し、高性能ネットワーク機器のアプリケーション向けに集積度や速度、最小限に抑えたレイテンシ、低減した消費電力を提供しています。

  •     超高速データレートと低いDRAMランダムアクセスレイテンシ<8ns tRC versus 46–52ns for DDR3.
  •    Multibank WRITE:Enables random read accesses with 1ns tRC.
  •    Minimal bus turnaround delay:読み込み-書き込みの遅延は1 IDLEサイクルです(DDR3では15以上)。
  •     No tFAW, tRRD:サイクリックバンクアクセス間のIDLEサイクルはゼロです(DDR3では27サイクル以上のtFAW)。
  •    最小バースト長:BL2、BL4、およびBL8では柔軟なメモリアクセスと完全なデータバス使用が可能です。
当社は、実装を容易にし、既存のRLDRAM2とDDR3 PHYをよりよく活用できるように、RLDRAM 3を慎重に設計しています。

さらに詳細な技術情報やサンプル要求については、当社までお問い合わせください。

RLDRAM 2 – 既にRLDRAM 2で設計されていますか?当社もお客様のためにアップグレードをご用意しています。
The introduction of RLDRAM 3 doesn’t mean current-generation RLDRAM 2 will be left behind.In fact, our RLDRAM 2 products are migrating to a more advanced 50nm process technology, reducing power consumption across the board and upgrading the current 288Mb device to 1066 Mb/s and 15ns tRC.当社は今後長年にわたってRLDRAM 2をサポート・改善する取り組みを続けていきます。

  •    576Mb RL2シュリンク(SIO/CIO) – メイン動作電流が33% ~ >40%に低減
  •    288Mb RL2シュリンク(CIO) – メイン動作電流が25% ~ >40%に低減
  •    288Mb RL2シュリンク(SIO) – メイン動作電流が10% ~ >25%に低減

  仕様     Benefit
密度  288Mb, 576Mb Available in two densities, providing flexibility for many designs
コンフィギュレーション x9, x18, x36 Available in wide bus widths with minimal part counts in wide-bus configured systems; common or separate I/O
供給電圧 1.8V core; 1.5V or 1.8V I/O HSTL and SSTL I/O compatibility
クロック周波数 200–533 MHz Achieves 400–1,067 Mb/s per pin
温度範囲 0°C to +95°C
40°C to +95°C
Increased operating range for optimum functionality in extreme environments
Latency tRC = 8ns Fast random access
Bandwidth Up to 38.4 Gb/s High sustainable performance
Improved Signal Integrity Programmable Output Impedance Enables clean, high-frequency operation
Addressing Multiplexed/Non-Multiplexed Address Modes Adds flexibility to board design
Fault Detection JTAG Boundary Scan Essential for testing boards with a high number of components

RLDRAM 3 Design Guide

Learn more about the new features and functions of RLDRAM 3 with our Design Guide.The Guide contains practical recommendations that enable board designers to develop a high-performance memory subsystem while ensuring stability for long-term reliable operation of the device.For more information,see our RLDRAM 3 Design Guide.

タイプ 安全性 題名および説明 ID番号 更新日 サイズ
IBIS Behavioral Models: マイクロンは長年IBISオープンフォーラムのメンバーであり、IBIS仕様を完全にサポートします。ほとんどのマイクロン社製品のIBISモデルはマイクロン社ウェブサイトからダウンロードできます。 TN-00-07 11/2009 163.98 KB
Thermal Applications: マイクロンのコンポーネントおよびモジュールが最大許容温度を超えないようにするための一般方法や条件を定義します。 TN-00-08 05/2010 252.18 KB
Understanding Quality and Reliability Requirements for Bare Die Applications: ベアダイ アプリケーションに必要とされる品質や信頼性を定義します。 TN-00-14 10/2009 152.83 KB
Recommended Soldering Parameters: マイクロン テクノロジー製品に推奨されるはんだ付けテクニックやパラメータを定義します。 TN-00-15 03/2007 69.09 KB
Uprating of Semiconductors for High-Temperature Applications: 温度の改良やコンポーネント使用にかかわるリスク、製造元の環境仕様外のシステムに関連する問題を説明します。 TN-00-18 05/2010 428.33 KB
Understanding Signal Integrity: 新製品のコンセプトから製造中止を通じてメモリーデザインやテスト、確認ツールを最大限に利用する方法を説明します。 TN-00-20 12/2009 1.52 MB
SEMI Wafer Map Format: マイクロン社では半導体製造装置材料協会 (SEMI) によって認証されたウェハマップ ファイル形式を採用しています。マイクロン社のお客様はSEMI形式によって一貫して互換性が高く、信頼できるマップファイルを常に受け取ることができます。 TN-00-21 02/2009 110 KB
RLDRAM 2 Design Guide: Describes the general features of circuit implementations using RLDRAM 2 memory architecture TN-49-01 06/2008 329.19 KB
Exploring the RLDRAM 2 Feature Set: Outlines the performance-enhancing features offered by RLDRAM 2 architecture TN-49-02 12/2006 453.86 KB
RLDRAM 2 Clocking Strategies: Addresses the operation of the RLDRAM 2 device outside the specified range of clock periods and the timing changes that occur in this mode of operation TN-49-03 05/2007 305.07 KB
Calculating Memory System Power for RLDRAM 2: Details how RLDRAM 2 devices consume power and provides tools to estimate power consumption TN-49-04 11/2007 1.64 MB
PCN/EOL Systems: マイクロン社製品の変更通知や製造中止システムについて説明します。 CSN-12 04/2012 79.21 KB
Wafer Packaging and Packaging Materials: マイクロン社製品の発送に使用される各材料についての配送およびリサイクルに関する総合情報を提供します。 CSN-20 09/2011 776.24 KB
Bare Die SiPs and MCMs: ベアダイSiPおよびMCMに対するデザインの考えを説明します。 CSN-18 04/2009 151.06 KB
Shipping Quantities: 部品数の表を提供します。 CSN-04 04/2012 472.27 KB
Micron KGD Definitions: マイクロン社製KGD-C1およびKGD-C2 DRAMダイのテスト仕様とパラメータを説明します。 CSN-22 07/2009 65.52 KB
Micron Component and Module Packaging: マイクロン社のパッケージラベルと手順について説明します。 CSN-16 02/2012 887.13 KB
ESD Precautions for Die/Wafer Handling and Assembly: 生産コストの削減に繋がる、作業環境においてESDを制御することのメリット(高い生産性や向上した品質と信頼性を含む)を説明します。 CSN-24 08/2010 119.08 KB
Electronic Data Interchange: EDI送信セット、プロトコルおよび問い合わせ先を説明します。 CSN-06 09/2005 53.5 KB
RMA Procedures for Packaged Product and Bare Die Devices: 標準の返品承認(RMA)手順と、ベアダイのRMAに関する違いをまとめています。 CSN-07 10/2010 82.64 KB
ISO System Management Standards: ISOシステム管理基準について説明します。 CSN-08 04/2004 39.18 KB
The Future of Memory and Storage: メインメモリとFlashメモリの傾向についての概要 12/2009 1.54 MB
RLDRAM II Power Calculator 08/2011 281 KB
DRAM Component Part Numbering System: DDR3/DDR2/DDR/SDR SDRAM、 モバイルLPDRAMおよびRLDRAMコンポーネントの部品番号ガイド 04/2012 36.89 KB
FBGA Date Codes: FBGA梱包済みコンポーネントの日付コード 08/2005 22.36 KB
Moisture Absorption in Plastic Packages: Describes shipping procedures for preventing memory devices from absorbing moisture and recommendations for baking devices exposed to excessive moisture TN-00-01 02/2010 87.26 KB
Accelerate Design Cycles with Simulation Models: マイクロンでは、レイアウトの前に新しいデザインを確認するのに必要なツールとガイドラインを提供します。本テクニカルノートではソフトウェア モデルのサポート、シグナル インテグリティの最適化および倫理回路デザインについて説明します。 TN-00-09 02/2010 206.91 KB
Micron Wire-Bonding Techniques: 本テクニカルノートでは、マイクロン社製品のニッケル パラジウム(NiPd)およびアルミニウム(Al)両方に対するワイヤボンディング テクニックのガイダンスを提供します。 TN-00-22 11/2010 66.13 KB
Leverage Existing RLDRAM® 2 and DDR3 PHY to Design in New RLDRAM: RLDRAM 3 and DDR3 PHY features comparison, highlighting how both RLDRAM 2 and DDR3 PHY can be easily leveraged to design in RLDRAM 3. プレゼンテーション 05/2011 75.75 KB
Micron BGA Manufacturer's User Guide: 最新型および旧型両方のマイクロン社ボール グリッド アレイ(BGA)パッケージを製造プロセスに簡単に統合できる情報をお客様に提供します。通常のパッケージ関連および製造行程の実践を説明した高レベルなガイドラインと参照マニュアルがセットになっています。 CSN-33 07/2011 353.32 KB
RLDRAM 3 Design Guide: Contains practical recommendations for developing high-performance memory subsystems while ensuring stability for long-term reliable operation of the devices. TN-44-01 08/2011 723.41 KB
RLDRAM 3 Power Calculator 08/2011 290 KB
Product Marks/Product and Packaging Labels: 製品の部品マーキングと製品およびパッケージラベルについて説明します。 CSN-11 04/2012 724.89 KB
RLDRAM Memory Flyer : Describes the high-bandwidth, low-latency, high-density features of RLDRAM 3 and RLDRAM 2 memory 製品広告チラシ 02/2012 738.96 KB
Bypass Capacitor Selection for High-Speed Designs: 高速デザインに対するバイパス コンデンサの選択について説明します。 TN-00-06 03/2011 481.9 KB

注意:安全性の高い文書 (安全ロック) を表示するにはログインするか、安全性の高い文書をクリックしてアクセスを要請してください。

Are CK/CK# and DK/DK# true differential inputs?
Yes, the CK/CK# and DK/DK# input buffers are true differential inputs.Both sets of clocks need to meet the specifications that are defined in the Clock Input Operating Conditions tables in the RLDRAM II memory data sheets.
Are there any new features in RLDRAM 3 not found in earlier generations of the RLDRAM product line?
Yes. Multibank write is a new feature that enables SRAM-like random read capabilities.Managing refresh overhead is now more flexible than ever with the addition of the MULTIBANK REFRESH command.With this command, you can refresh one to four banks simultaneously.We’ve also added a mirror function ball to ease layout of clamshell designs.Depending upon the state of the mirror function ball, the command and address functions are swapped across the y-axis to allow for direct connections through the PCB.
Can 2.5V or 3.3V be directly input to joint test action group (JTAG) pins?
No. The highest operating voltage that can be input to the JTAG pins is VDD + 0.3V as outlined in the TAP DC Electrical Characteristics and Operating Conditions tables in the RLDRAM II data sheets.
Can I connect the “Do Not Use” (DNU) pins to ground (GND)?
Yes. However, when on-die termination (ODT) is enabled, the DNU pins will be connected to VTT.Connecting the DNU pins to GND under these circumstances will cause a substantially larger load on your VTT supply.
Can I reload the mode register after I have been operating with READs and WRITEs on RLDRAM II memory?
Yes, the mode register can be reloaded at any time as long as all timing specifications are met.Burst length must be considered, however.If the burst length is changed, previously written data will be corrupted.
Can RLDRAM II run slower than 175 MHz?
Yes, but the DLL must be turned off.With the DLL turned off, the output data alignment with the CK will shift by about 3–4ns, which works like the outputs of RLDRAM I memory.
Does the 576Mb RLDRAM II device still support 1.8V VDDQ?Is it possible to run at 533 MHz with VDDQ = 1.8V?
It should not be a problem to run at 533 MHz with VDDQ = 1.8V. Micron has run graphics devices at 800 MHz clock at 1.8V.
Does the RLDRAM internally compensate for voltage and temperature changes when bit A8 is not selected HIGH on the RLDRAM II during setting of the mode register?
Yes. When bit A8 of the mode register is HIGH, the user places an external precision resistor between ZQ and VSS to select an output impedance.When bit A8 is LOW, the output impedance is set to 50 ohms (±30 percent).In both cases, however, the RLDRAM device periodically calibrates this impedance to compensate for shifts in voltage and temperature.This calibration is internal to the RLDRAM and does not affect the operation of the RLDRAM.
During initialization, are 2,048 clock cycles really needed between each AUTO REFRESH command?
No. Although it is still outlined in some older data sheet revisions, it is not necessary.During initialization, it is necessary for all eight banks to receive an AUTO REFRESH command tMRSC after the last valid MRS command has been issued.If you sequentially issue AUTO REFRESH commands instead of waiting 2,048 clock cycles between each command, you must perform at least 1,024 NOP commands between the last AUTO REFRESH command and the first valid command in normal operation.Either method will satisfy the requirements of the RLDRAM.
During power-up, I bring VDDQ HIGH before VDD.Will this cause a problem?
The RLDRAM II will not be adversely affected if you bring VDDQ HIGH before VDD.However, you must be aware that when you perform the sequence in this way, the DQs, DM, and all other pins with an output driver will go HIGH instead of tri-stating.These pins will remain HIGH until VDD is at the same level as VDDQ.Care should be taken to avoid bus conflicts during this period.
How can I reset the RLDRAM II device?
RLDRAM II memory can be reset using the MODE REGISTER command.Three MRS commands must be issued on consecutive clock cycles to reset the device properly.If any commands (including NOP commands) are issued between the MRS commands, the device will not be reset.
How is RLDRAM II memory similar to SRAM?
RLDRAM II memory is similar to SRAM in a variety of ways:- Simplified command set:only four commands (READ, WRITE, REFRESH, and MODE REGISTER SELECTION) - Row/columns not apparent:can clock in the full address in one clock cycle (or can be multiplexed like a standard DRAM) - Fast cycle time:20ns tRC for the 288Mb device and as low as to 15ns tRC for the 576Mb device
I’m using RLDRAM memory.Is it possible to tie VDD and VDDQ to the same supply?
Yes. You can tie VDD and VDDQ to the same supply.
Is MAX power specified in the data sheet?
Yes, MAX power is specified in the data sheet.Because MAX power is entirely dependent on how the devices are used in a system, the power must be calculated based on information found in the data sheet.In addition to the information found in the data sheet, Micron’s Web site provides a system power calculator to help calculate MAX power based on system use conditions.
Is the tRC timing parameter asynchronous?
No. You must wait the number of clock cycles that correspond with the tRC value for a given configuration before you issue a command to the same bank.For example, if you are using configuration three, you must wait eight clock cycles before you issue another command to the same bank regardless of the operating frequency.
I’ve heard about the new multibank write feature on RLDRAM 3.What exactly is this feature?
Multibank write is a feature that allows for SRAM-like random read access time.Using this feature can reduce RLDRAM 3’s already low tRC (<10ns) by up to 75% during reads.Through the RLDRAM 3 mode register, you can choose to write to one, two, or four banks simultaneously.By storing identical data in multiple banks, the memory controller has the flexibility to determine which bank to read the data from in order to minimize tRC delay.
I’ve heard you’ll be sampling RLDRAM 3 memory in 2011.Do I need to switch to RLDRAM 3?
Not necessarily.While RLDRAM 3 memory offers several performance advantages over RLDRAM 2 memory (it’s twice as fast), we plan to support RLDRAM 2 for a long time.So there’s no urgent need to roll your design.In fact, our die shrink for RLDRAM 2 memory (also coming in 2011) shouldn’t necessitate a design change for existing customers.Contact your Micron representative if you have questions.
Now that you’re introducing RLDRAM 3 technology, should I be concerned about the lifespan for RLDRAM 2 memory?
No. While we’re developing RLDRAM 3 technology we’re also updating the design for RLDRAM 2 memory, transitioning it to our leading 300mm fabs.This process shrink will reduce power consumption and increase performance for the 288Mb product, but most importantly, it will allow us to support RLDRAM 2 memory well into the next decade.
What termination values does DDR3 offer?
DDR3 supports Rtt_Nom values of 120, 60, 40, 30, and 20 ohms.Dynamic ODT (Rtt_Wr) values are 120 and 60 ohms.
When can I get RLDRAM 3 memory?
Early RL 3 samples are available now, with qualified (QS) parts expected in fall 2011, and production beginning at the end of 2011.For more information, request an RLDRAM 3 data sheet.
When I upgrade my system memory from 288Mb to 576Mb RLDRAM II, what design considerations do I need to pay attention to?
The 576Mb RLDRAM II device has been designed as a drop-in solution when upgrading from the 288Mb density.Only one additional address pin is needed to support this upgrade.Also, because of the increase in density, the 576Mb device must be refreshed twice as often as the 288Mb device (131,072 refresh commands for the 576Mb device versus 65,536 refresh commands for the 288Mb device every 32ms).The 576Mb device should meet all other existing timing specifications for a comparable 288Mb speed grade.
Which high-speed transceiver logic (HSTL) class do the RLDRAM II DQs comply with?
The RLDRAM II DQs comply both with HSTL class I and HSTL class II because the DQs’ output impedance can be selected to meet the IOH/IOL requirements of each class.The output impedance is selectable when the MRS bit A8 is set HIGH and an external precision resistor is connected to the ZQ pin.Output impedance values of 25–60 ohms can be chosen when a resistor of five times the desired value is placed between the ZQ ball and VSS.For example, a 300 ohm resistor is required for an output impedance of 60 ohms.With the option of using a 1.8V output voltage and programmable output impedance, the RLDRAM II can also operate in an SSTL environment, although it is not compliant with this standard.
Will I be able to leverage any existing DRAM technology to ease the adoption of RLDRAM 3 in my system?
Yes. Even though RLDRAM 3 is a new architecture, it leverages many features from both DDR3 and RLDRAM 2 to make adoption and integration as easy as possible.The command protocol, addressing, and strobing scheme are the same as RLDRAM 2, while the I/O, AC timing, and read training register very closely resemble those found in DDR3.
I’m seeing substantial jitter on my outputs; what can I do to remedy this?
A number of things can cause jitter on RLDRAM II memory outputs.Read through the questions below to help identify the cause of the jitter.- Is the same amount of jitter seen at the DQs, QKs, and QVLD signal?If so, the jitter may be due to the DLL.The DQs, QKs, and QVLD all use the DLL to clock out their data.Micron can assist with additional debugging to determine whether any parameters are being violated that would cause the DLL to operate improperly.
- Is there jitter on the input clocks?Any jitter on CK/CK# will be transferred to the outputs.
- Does the amount of jitter change substantially with different output data?If it does, phenomena such as ISI, SSO, or crosstalk could be causing the jitter.
- Is the system properly terminated?Because proper termination is dependent on system parameters, simulation is the best way to determine termination requirements.Micron offers several tools and technical notes to assist with termination requirements:
1.“TN-49-02:Exploring the RLDRAM II Feature Set” includes descriptions and examples of data-eyes when using the on-die termination and impedance-matching features.
2.Technical notes TN-46-14 and TN-46-06 do not specifically mention RLDRAM II memory, but they have useful information about termination and techniques to ensure good signal integrity.
3.The RLDRAM Memory Part Catalog contains configuration information for IBIS and HSpice models.